Embedded
Smart Factory Connectivity for the Industrial IoT
Manufacturers, with innovation driven by the Industrial Internet of Things (IIoT), are poised to significantly...
Motion Processing: The Next Breakthrough Function in Handsets
Motion processing is emerging as the only solution that can deliver a new user interface and experience...
MODELING OF SYNTHETIC JET EJECTORS FOR ELECTRONICS COOLING
This paper presents the modeling results for prediction of thermal performance using synthetic jets ejectors....
ANSI COMPLIANCE MATRIX ANS/ISO 9899-1990
CCS C Compilers for PIC® MCU and dsPIC® DSC V4.1xx This whitepaper includes the ANSI compliance matrix...
Pre-tested System-on-Chip Design Accelerates PLD Development
Many moderate size Programmable Logic Device (PLD) designs, especially those in control plane applications,...
Time Domain Scans Vs. Stepped Frequency Scans
Rohde and Schwarz launched with the RandS ESU the world's first commercial EMI test receiver capable...
dB or not dB?
True or false: 30 dBm + 30 dBm = 60 dBm? Why does 1% work out to be -40 dB one time but then 0.1 dB or...
Virtium TuffDrive® PATA SSDs
Virtium TuffDrive Parallel ATA (PATA) solid state drives (SSDs) are direct replacements for legacy PATA...
Reducing CompactFlash Re-Qualification Time
Industrial grade CompactFlash (CF) has been a storage workhouse for embedded systems since the turn of...
Low-Voltage Energy Harvesting
Over the past few years, the technology of energy harvesting has emerged from the laboratory to the marketplace....
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