Power

Factorized Power Architecture and VI Chips
As electronic systems continue to trend toward lower voltages with higher currents and as the speed of...

X-500 / X-55 Series Power Fail Protection
The X-500 and X-55 SSDs use an internal DRAM, but only management data is cached in the DRAM, no user...

Conformance Test Failed, What Now?
Conformance tests are performed on serial data interfaces such as USB, HDMI and PCI Express to ensure...

eGaN® FET Electrical Characteristics
In this paper the basic electrical characteristics of eGaN FETs are explained and compared against silicon...

Well rounded Fiber-Optic M12 Data Connectors
Fiber-optic circular connectors optimize data transmission from the field to the control level. As the...

Battery Holder Design and Testing, ANSI, EIA, UL
For testing new designs of battery holders, MPD fabricated min-max sized battery slugs. The slugs proved...

Moving Beyond Zigbee® for Star Networks
Multi-hop mesh protocols, such as Zigbee® , are getting a lot of press for their ability to link together...

Energy Harvesting for a Greener Environment
Energy Harvesting (EH) is the process of electronically capturing and accumulating energy from a variety...

Improving FSWP Measurement Speed
For automated test applications, measurement time is often as important as the quality of the measurement....

White Paper 1: The Need for Security
With the recent rise of the Internet of Things (IoT), 14 billion devices are now connected. However,...
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